Optical Sectioning Structured Illumination Microscope MS—OM/OS—SIM—001

MS-M/OS-SIM-001 adopts cutting-edge structured light illumination technology. A spatial light modulator is used to generate specific structured light, which is accurately projected onto the sample. Optical modulation is utilized to rapidly acquire section images. It breaks through the diffraction limit of traditional optical microscopes, enabling super-resolution imaging. Even sub-micrometer-level microstructures can be clearly revealed.

Product Details

Specifications and Parameters

Main ParametersTechnical Indicators (Ordinary OS-SIM)Technical Indicators (Super-Resolution OS-SIM)
Light SourceLED light source (optional wavelengths: 365/470/555/630nm)
ModeWidefield, OS-SIM, 3D tomography
Horizontal Resolution≤330nm (widefield), ≤260nm (OS-SIM)≤120nm (OS-SIM)
Vertical Resolution≤600nm≤300nm
Imaging Speed30FPS
Section SpacingAdjustable from 10nm-100μmAdjustable from 10nm- 100μm (user-selectable)
Reconstruction Speed1 layer/s (2048 × 2048)1 layer/s (2048 × 2048); 20 layers/s (2048 × 2048) customizable
Sample Thickness≤200μm
Field of View≥130μm × 110μm (100X oil immersion objective)
Camera4-megapixel (2048 × 2048), 95% quantum efficiency

Functional Features

  • Multi-wavelength Microscopy
  • High-speed Imaging
  • Ultra-high Resolution
  • Real-time 3D Reconstruction
  • Automated Control
  • Advanced Illumination and Stable Imaging
  • Compatibility and Low phototoxicity

Application Fields

Biomedicine,Materials Science,Cell Biology,Neuroscience,Drug R&D,Industrial Inspection

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